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Advances in Embedded and Fan-Out Wafer Level Packaging Technologies
Language: en
Pages: 576
Authors: Beth Keser
Categories: Technology & Engineering
Type: BOOK - Published: 2019-02-12 - Publisher: John Wiley & Sons

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Examines the advantages of Embedded and FO-WLP technologies, potential application spaces, package structures available in the industry, process flows, and mate
Embedded and Fan-Out Wafer and Panel Level Packaging Technologies for Advanced Application Spaces
Language: en
Pages: 324
Authors: Beth Keser
Categories: Technology & Engineering
Type: BOOK - Published: 2021-12-29 - Publisher: John Wiley & Sons

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Discover an up-to-date exploration of Embedded and Fan-Out Waver and Panel Level technologies In Embedded and Fan-Out Wafer and Panel Level Packaging Technologi
Heterogeneous Integrations
Language: en
Pages: 381
Authors: John H. Lau
Categories: Technology & Engineering
Type: BOOK - Published: 2019-04-03 - Publisher: Springer

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Heterogeneous integration uses packaging technology to integrate dissimilar chips, LED, MEMS, VCSEL, etc. from different fabless houses and with different funct
Antenna-in-Package Technology and Applications
Language: en
Pages: 416
Authors: Duixian Liu
Categories: Technology & Engineering
Type: BOOK - Published: 2020-03-31 - Publisher: John Wiley & Sons

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A comprehensive guide to antenna design, manufacturing processes, antenna integration, and packaging Antenna-in-Package Technology and Applications contains an
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Language: en
Pages: 198
Authors: Sudarshan Bahukudumbi
Categories: Technology & Engineering
Type: BOOK - Published: 2010 - Publisher: Artech House

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Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer