This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applicatio

This book is specifically designed for the user who wishes expanded use of ellipsometry beyond the relatively limited number of turn-key applications. The book

Excerpt from Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings, Washington 1963; Symposium Held September 5-6, 1963, at the Nati