This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and technique

Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präpara

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and technique

The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM I

Includes bibliographical references and index.