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ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Language: en
Pages: 540
Authors: ASM International
Categories: Technology & Engineering
Type: BOOK - Published: 2019-12-01 - Publisher: ASM International

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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of
Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
Language: en
Pages: 262
Authors: Wilson Tan
Categories: Technology & Engineering
Type: BOOK - Published: 2001 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)

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This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Silicon-on-Insulator Technology: Materials to VLSI
Language: en
Pages: 375
Authors: J.-P. Colinge
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Silicon-on-Insulator Technology: Materials to VLSI, Third Edition, retraces the evolution of SOI materials, devices and circuits over a period of roughly twenty
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Language: en
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ISTFA 2010
Language: en
Pages: 487
Authors:
Categories: Technology & Engineering
Type: BOOK - Published: 2010-01-01 - Publisher: ASM International

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