RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Download or read book RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range written by Mueller, Daniel and published by KIT Scientific Publishing. This book was released on 2018-11-22 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.