This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for sc

to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron ener

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-volt

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes