This title introduces state-of-the-art design principles for SOI circuit design, and is primarily concerned with circuit-related issues. It considers SOI materi

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) c

The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was abou

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each

Written by a Federal Aviation Administration (FAA) consultant designated engineering representative (DER) and an electronics hardware design engineer who togeth