This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) co

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-sca

This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra

This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technol