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MOSFET Hot Carrier Reliability for Cryogenic Operation
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MOSFET Hot Carrier Reliability for Cryogenic Operation

Authors: Miryeong Song
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Type: BOOK - Published: 1994 - Publisher:

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Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature
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Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature

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Device and Circuit Cryogenic Operation for Low Temperature Electronics
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Device and Circuit Cryogenic Operation for Low Temperature Electronics

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Device and Circuit Cryogenic Operation for Low Temperature Electronics is a first in reviewing the performance and physical mechanisms of advanced devices and c
Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
Language: en
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Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures

Authors: Sherry Shu Ting Yao
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The Effect of Hot-carrier and Fowler-Nordheim Injection on VLSI MOSFET at Room and Cryogenic Temperatures
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The Effect of Hot-carrier and Fowler-Nordheim Injection on VLSI MOSFET at Room and Cryogenic Temperatures

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