Filling the gap for a description of the optical properties of small particles with sizes less than 1000 nm and to provide a comprehensive overview on the spect

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principle

This book introduces the fascinating world of plasmonics and physics at the nanoscale, with a focus on simulations and the theoretical aspects of optics and nan

Optical properties are among the most fascinating and useful properties of nanomaterials and have been extensively studied using a variety of optical spectrosco

This volume contains papers presented at the NATO Advanced Research Workshop (ARW) Dynamic Interactions in Quantum Dot Systems held at Hotel Atrium in Puszczyko