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Language: en
Pages: 215
Pages: 215
Type: BOOK - Published: 2019-06-12 - Publisher: Springer
This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. Th
Language: en
Pages: 439
Pages: 439
Type: BOOK - Published: 2016-04-28 - Publisher: IET
Continuing from volume 1, this volume outlines circuit- and system-level design approaches and issues for these devices. Topics covered include self-healing ana
Language: en
Pages: 606
Pages: 606
Type: BOOK - Published: 2020-12-09 - Publisher: Springer Nature
This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly wi
Language: en
Pages: 383
Pages: 383
Type: BOOK - Published: 2016-04-12 - Publisher: IET
Over two volumes this work describes the modelling, design, and implementation of nano-scaled CMOS electronics, and the new generation of post-CMOS devices, at
Language: en
Pages: 597
Pages: 597
Type: BOOK - Published: 2020-06-08 - Publisher: Springer Nature
In this book, a global team of experts from academia, research institutes and industry presents their vision on how new nano-chip architectures will enable the