On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond
| Author | : Andrej Rumiantsev |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 2024-10-21 |
| ISBN-10 | : 8770043566 |
| ISBN-13 | : 9788770043564 |
| Rating | : 4/5 (66 Downloads) |
Book Synopsis On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond by : Andrej Rumiantsev
Download or read book On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond written by Andrej Rumiantsev and published by . This book was released on 2024-10-21 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
