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Transmission Electron Microscopy and Diffractometry of Materials
Language: en
Pages: 775
Authors: Brent Fultz
Categories: Science
Type: BOOK - Published: 2012-10-14 - Publisher: Springer Science & Business Media

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T
Transmission Electron Microscopy and Diffractometry of Materials
Language: en
Pages: 764
Authors: Brent Fultz
Categories: Science
Type: BOOK - Published: 2012-10-13 - Publisher: Springer Science & Business Media

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T
Transmission Electron Microscopy and Diffractometry of Materials
Language: en
Pages: 778
Authors: Brent Fultz
Categories: Science
Type: BOOK - Published: 2002 - Publisher: Springer Science & Business Media

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Inelastic electron scattering and spectroscopy. Diffraction from crystals. Electron diffraction and crystallography.
Transmission Electron Microscopy and Diffractometry of Materials
Language: en
Pages: 771
Authors: Brent Fultz
Categories: Technology & Engineering
Type: BOOK - Published: 2007-11-04 - Publisher: Springer Science & Business Media

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This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully
Introduction to Conventional Transmission Electron Microscopy
Language: en
Pages: 741
Authors: Marc De Graef
Categories: Science
Type: BOOK - Published: 2003-03-27 - Publisher: Cambridge University Press

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A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.