This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles an

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr

Since its development toward the end of the past millennium, high-resolution Inelastic X-Ray Scattering (IXS) has substantially improved our knowledge of the co

The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations ca