Atomic Force Microscopy/Scanning Tunneling Microscopy
| Author | : Samuel H. Cohen |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 468 |
| Release | : 1994 |
| ISBN-10 | : 9780306448904 |
| ISBN-13 | : 0306448904 |
| Rating | : 4/5 (04 Downloads) |
Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy by : Samuel H. Cohen
Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1994 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.
