Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Download or read book Built-in-Self-Test and Digital Self-Calibration for RF SoCs written by Sleiman Bou-Sleiman and published by Springer Science & Business Media. This book was released on 2011-09-23 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.