Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature
Author | : SeokWon Abraham Kim |
Publisher | : |
Total Pages | : 302 |
Release | : 1999 |
ISBN-10 | : OCLC:43496249 |
ISBN-13 | : |
Rating | : 4/5 (49 Downloads) |
Book Synopsis Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature by : SeokWon Abraham Kim
Download or read book Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature written by SeokWon Abraham Kim and published by . This book was released on 1999 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: