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ISTFA 2013
Language: en
Pages: 634
Authors: A. S. M. International
Categories: Technology & Engineering
Type: BOOK - Published: 2013-01-01 - Publisher: ASM International

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide
ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Language: en
Pages: 593
Authors: ASM International
Categories: Technology & Engineering
Type: BOOK - Published: 2018-12-01 - Publisher: ASM International

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The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to Novembe
ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Language: en
Pages: 540
Authors: ASM International
Categories: Technology & Engineering
Type: BOOK - Published: 2019-12-01 - Publisher: ASM International

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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of
ISTFA 2014
Language: en
Pages: 561
Authors: A. S. M. International
Categories: Technology & Engineering
Type: BOOK - Published: 2014-11-01 - Publisher: ASM International

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the s
Microelectronics Fialure Analysis Desk Reference, Seventh Edition
Language: en
Pages: 719
Authors: Tejinder Gandhi
Categories: Technology & Engineering
Type: BOOK - Published: 2019-11-01 - Publisher: ASM International

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM I