Review of Subcritical Source-Driven Noise Analysis Measurements

Review of Subcritical Source-Driven Noise Analysis Measurements
Author :
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Total Pages : 65
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ISBN-10 : OCLC:1061382835
ISBN-13 :
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Download or read book Review of Subcritical Source-Driven Noise Analysis Measurements written by and published by . This book was released on 1999 with total page 65 pages. Available in PDF, EPUB and Kindle. Book excerpt: Subcritical source-driven noise measurements are simultaneous Rossi-? and randomly pulsed neutron measurements that provide measured quantities that can be related to the subcritical neutron multiplication factor. In fact, subcritical source-driven noise measurements should be performed in lieu of Rossi-? measurements because of the additional information that is obtained from noise measurements such as the spectral ratio and the coherence functions. The basic understanding of source-driven noise analysis measurements can be developed from a point reactor kinetics model to demonstrate how the measured quantities relate to the subcritical neutron multiplication factor. More elaborate models can also be developed using a generalized stochastic model. These measurements can be simulated using Monte Carlo codes to determine the subcritical neutron multiplication factor or to determine the sensitivity of calculations to nuclear cross section data. The interpretation of the measurement using a Monte Carlo method is based on a perturbation model for the relationship between the spectral ratio and the subcritical neutron multiplication factor. The subcritical source-driven noise measurement has advantages over other subcritical measurement methods in that reference measurements at delayed critical are not required for interpreting the measurements. Therefore, benchmark or in-situ subcritical measurements can be performed outside a critical experiment facility. Furthermore, a certain ratio of frequency spectra has been shown to be independent of detection efficiency thereby making the measurement more robust and unaffected by drifts or changes in instrumentation during the measurement. Criteria have been defined for application of this measurement method for benchmarks and in-situ subcritical measurements. An extension of the source-driven subcritical noise measurement has also been discussed that eliminates the few technical challenges for in-situ applications.


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