Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits
Author | : Kenneth Michael Butler |
Publisher | : |
Total Pages | : 294 |
Release | : 1990 |
ISBN-10 | : OCLC:24387703 |
ISBN-13 | : |
Rating | : 4/5 (03 Downloads) |
Book Synopsis Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits by : Kenneth Michael Butler
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