This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone severa

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testin

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's