Related Books
Language: en
Pages: 506
Pages: 506
Type: BOOK - Published: 1997-01-30 - Publisher: Cambridge University Press
The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological
Language: en
Pages: 224
Pages: 224
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Language: en
Pages: 368
Pages: 368
Type: BOOK - Published: 1974 - Publisher:
Language: en
Pages: 247
Pages: 247
Type: BOOK - Published: 2008-12-22 - Publisher: John Wiley & Sons
Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and
Language: en
Pages: 196
Pages: 196
Type: BOOK - Published: 2016-07-01 - Publisher: Springer
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus