Thermal-Aware Testing of Digital VLSI Circuits and Systems

Download or read book Thermal-Aware Testing of Digital VLSI Circuits and Systems written by Santanu Chattopadhyay and published by CRC Press. This book was released on 2018-04-24 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips